SemTest semiconductor reliability ATE
Reliability and characterisation test for power semiconductors.
What it is for here
British compound-semiconductor work concentrates around a small number of clusters, and reliability test is where a device programme either earns its qualification data or does not.
Why it is on the UK site
Own IP, and a capability with very few British suppliers.
Specifications
A system’s figures follow from its configuration — the instruments in the rack and what the sequence asks of them. Rather than reprint a table for a configuration you may not need, send the requirement — the standard, the device under test, the power envelope and the cadence — and an engineer will come back against the current document.
Other systems
- Programmable DC with arbitrary transient sequencingThe DC side of military land-platform testing — wide input, and transients you cannot produce with a bench supply.
- Procyon PTS 2100 power supply test systemA turnkey system for testing power supplies and converters at production cadence.
- CTS4000 battery test systemCycling and characterisation for cells, modules and packs.
- PowerStar test executiveThe software layer that sequences a test and produces the record of it.