SemTest semiconductor reliability ATE
Reliability and characterisation test for power semiconductors.
What it is for here
British compound-semiconductor work concentrates around a small number of clusters, and reliability test is where a device programme either earns its qualification data or does not.
Why it is on the UK site
Own IP, and a capability with very few British suppliers.
Specifications
Published figures for this line are held on the manufacturer’s current datasheet, and they change. Rather than reprint a table that goes stale, send the requirement — the standard, the device under test, the power envelope and the cadence — and an engineer will come back against the current document.
Other systems
- PAS-F regenerative AC source and grid simulatorThe variable AC test supply G99 Annex A.7.1.2.2 describes, with the absorbed power returned to the grid rather than dissipated.
- AMF 400 Hz aircraft AC source400 Hz ground power for airborne equipment test.
- AFV and AFV+ programmable AC sourceGeneral-purpose programmable AC where the requirement is a clean, controllable supply rather than grid emulation.
- Programmable DC with arbitrary transient sequencingThe DC side of military land-platform testing — wide input, and transients you cannot produce with a bench supply.